Program Committee
Chair : I. Vickridge (Paris)
V. Esaulov (Orsay)
P. Roncin (Orsay)
M. D’Angelo (paris)
D. Schmaus (Paris)
D. Jalabert (Grenoble)
J-J. Ganem (Paris)
C Deville-Cavellin (Paris)
Key figures
Spirit
Contact
To see
Scientific Topics
· Fundamentals of particle-matter interactions for high resolution depth profiling
· New devices and instruments for high resolution depth profiling
· Computer simulations of LEIS, MEIS, HR-RBS and HR-ERD spectra, including channelling effects
· High Resolution interface analysis
· Surface structure determination
· Ultra-thin film growth processes
· High resolution depth profiling in nano-technology
· Ultra-thin film analysis for microelectronics, spintronics and optronics
Emrick Briand - 10/09/10